Normy JIS - Japonské technické normy - strana 659

Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

Norma vydána dne 20.11.2019

Surface chemical analysis -- Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry

Norma vydána dne 20.7.2020

Non-dispersive infrared gas analyzer

Norma vydána dne 31.1.1984

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Repeatability and constancy of intensity scale

Norma vydána dne 22.7.2014

Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Norma vydána dne 20.10.2015

Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis

Norma vydána dne 21.8.2017

Surface chemical analysis-Secondary ion mass spectrometry-Linearity of intensity scale in single ion counting time-of-flight mass analysers

Norma vydána dne 20.5.2025

Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Norma vydána dne 20.8.2018

Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Norma vydána dne 20.7.2021

Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Norma vydána dne 20.7.2021