Normy JIS - Japonské technické normy - strana 653

Surface chemical analysis -- Guidelines for preparation and mounting of specimens for analysis

Norma vydána dne 21.8.2017

Surface chemical analysis-Secondary ion mass spectrometry-Linearity of intensity scale in single ion counting time-of-flight mass analysers

Norma vydána dne 20.5.2025

Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Norma vydána dne 20.8.2018

Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer

Norma vydána dne 20.7.2021

Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

Norma vydána dne 20.7.2021

Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems

Norma vydána dne 22.11.2021

Surface chemical analysis-Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

Norma vydána dne 20.1.2026

Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters

Norma vydána dne 20.4.2010

Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Norma vydána dne 20.4.2010

Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials

Norma vydána dne 20.4.2010