ASTM F1190-93

DASIAC SR-94-009, April 1996,

Guide to Nuclear Weapons Effects Simulation Facilities and Techniques Available from Defense Special Weapons Agency, Washington, DC 20305-1000.

F1892-12(2018)

Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

F980-16(2024)

Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

E2450-23

Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

E1855-20

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

E264-19

Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Nickel

E265-15(2020)

Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32

E668-20

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

E720-23

Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics

E1250-15(2020)

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

E721-22

Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics

E722-19

Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics

E1249-15(2021)

Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

E1854-19

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts