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Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
Automaticky přeložený název:
Standardní zkušební metoda pro Strain Gradient měření tenkých filmů , které odrážejí pomocí optického Interferometr
NORMA vydána dne 1.11.2011
Označení normy: ASTM E2246-11
Poznámka: NEPLATNÁ
Datum vydání normy: 1.11.2011
Kód zboží: NS-44786
Počet stran: 21
Přibližná hmotnost: 63 g (0.14 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
cantilevers, combined standard uncertainty, fixed-fixed beams, interferometry, length measurements, microelectromechanical systems, MEMS, polysilicon, residual strain, round robin, stiction, strain gradient, test structure, Alignment, Calibration--metals/alloys analysis instrumentation, Cantilever testing, Combined standard uncertainty, Fixed-fixed beams, Interferograms/Interferometry, Length, Microelectromechanical systems (MEMS), Noncontacting optical strain measurement systems
Significance and Use | ||||||||||
Strain gradient values are an aid in the design and fabrication of MEMS devices. |
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1. Scope | ||||||||||
1.1 This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope. Measurements from cantilevers that are touching the underlying layer are not accepted. 1.2 This test method uses a non-contact optical interferometric microscope with the capability of obtaining topographical 3-D data sets. It is performed in the laboratory. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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2. Referenced Documents | ||||||||||
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