Piezoelectric devices and electromechanical filters. Method of checking the electrical strength of insulation

Norma vydána dne 1.3.2025

Epitaxial structures. Method for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference

Norma vydána dne 1.3.2025

Constant non-wireless high frequency resistors resistors and resistive absorbers. Attenuation measurement methods

Norma vydána dne 1.3.2025

Piezoelectric resonators. Methods of measuring the accuracy of the setting

Norma vydána dne 1.3.2025

High-voltage kenotrons. Method of measuring the temperature of the cylinder

Norma vydána dne 1.3.2025

Electro-optical elements. Methods for measuring the tangent of dielectric loss angle

Norma vydána dne 1.3.2025

Dissectors. Method for determining the counting rate of signal and dark pulses

Norma vydána dne 1.3.2025

Condenser mica. Specifications

Norma vydána dne 1.1.1984

Dissectors. Dark current measurement method

Norma vydána dne 1.3.2025

Dissectors. Method for determining the nonlinearity of the light characteristic

Norma vydána dne 1.3.2025