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Semiconductor devices—Mechanical and climatic test methods—Part 12: Vibration, variable frequency

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Semiconductor devices—Mechanical and climatic test methods—Part 13: Salt atmosphere

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Semiconductor devices—Mechanical and climatic test methods—Part 15: Resistance to soldering temperature for through-hole mounted devices

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Semiconductor devices—Mechanical and climatic test methods—Part 17: Neutron irradiation

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