Normy JIS - Japonské technické normy - strana 662

Surface chemical analysis -- Total reflection X-ray fluorescence analysis of water

Norma vydána dne 22.11.2021

Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants

Norma vydána dne 20.4.2023

Surface chemical analysis-Scanning probe microscopy-Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method

Norma vydána dne 21.10.2024

Surface chemical analysis-Handling of specimens prior to analysis

Norma vydána dne 20.2.2026

Microbeam analysis -- Electron probe microanalysis -- Determination of experimental parameters for wavelength dispersive X-ray spectroscopy

Norma vydána dne 22.7.2013

Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Norma vydána dne 20.4.2010

Guideline for alignment procedure for identical location analysis between different microscopic measuring instruments

Norma vydána dne 20.1.2023

Common format for measurement and analysis data

Norma vydána dne 20.5.2024

Technical terms for analytical chemistry (General part)

Norma vydána dne 21.3.2013

Technical terms for analytical chemistry (optical part)

Norma vydána dne 20.12.2016