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IEEE 2427-2025
IEEE Standard for Analog Defect Modeling and Coverage
Přeložit název
NORMA vydána dne 9.1.2026
Informace o normě:
Označení normy: IEEE 2427-2025
Datum vydání normy: 9.1.2026
Kód zboží: NS-1254047
Počet stran: 112
Přibližná hmotnost: 367 g (0.81 liber)
Země: Mezinárodní technická norma
Kategorie: Technické normy IEEE
Anotace textu normy IEEE 2427-2025 :
New IEEE Standard - Active.
A defect coverage accounting method based on simulation models for defects observed within integrated circuits (ICs) is defined in this standard. The portion of a defect universe, comprising thousands or millions of reasonably likely defects, that is detected or “covered” by tests of analog and mixed-signal circuits depends on many factors, which this standard considers, such as detectability, process variations, defect characteristics, and redundancy. The contents of a defect coverage summary are specified and dozens of commonly used terms are clearly defined to aid communication about the quality of tested ICs.
ISBN: 979-8-8557-2362-5, 979-8-8557-2776-0, 979-8-8557-2777-7
Number of Pages: 112
Product Code: STDAPE28057, STD28383, STDPD28383
Keywords: AMS test, analog/mixed-signal test, analog test coverage, defect coverage, defective parts per million, design for test, DFT, DPPM, IEEE 2427(TM)
Category: Test Instrumentation and Techniques|Test Technology
Draft Number: P2427/D0.42, June 2025 - APPROVED DRAFT
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