IEEE 1696-2025

Anotace textu normy IEEE 1696-2025 :

Revision Standard - Active.

Electrical circuit probes are essential components in the test and evaluation of electrical and electronic systems, subsystems, and circuits. Consequently, having a broadly accepted method for interconnecting the item under test to the test instrumentation is necessary for the intercomparison and reproducibility of test results. Moreover, the incorporation of standard test and measurement procedures ensures greater repeatability and confidence in test results. Methods for measuring parameters indicative of a probe’s or probe system’s performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probes that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and details within this standard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors and having an input impedance at least five times greater than the impedance of the circuit under test.

ISBN: 979-8-8557-2634-3, 979-8-8557-3436-2, 979-8-8557-3437-9

Number of Pages: 59

Product Code: STDAPE28269, STD28823, STDPD28823

Keywords: common mode, frequency response, gain, IEEE 1696, input resistance, linearity, offset error, offset range, probe, probe-only, probe system, scattering parameters, test fixture, test methods, time response, transfer function

Category: Measurement Instruments and Techniques

Draft Number: P1696/D3, Sept 2025 - APPROVED DRAFT