Potřebujeme váš souhlas k využití jednotlivých dat, aby se vám mimo jiné mohly ukazovat informace týkající se vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
Automaticky přeložený název:
Standardní praxe pro Indentifying Prvky pomocí vrcholů Auger elektronové spektroskopie
NORMA vydána dne 10.4.2002
Označení normy: ASTM E827-95
Poznámka: NEPLATNÁ
Datum vydání normy: 10.4.2002
Kód zboží: NS-48143
Počet stran: 3
Přibližná hmotnost: 9 g (0.02 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
Auger electron spectroscopy, AES, spectroscopy, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
Significance and Use | ||||||||||
Auger analysis is used to determine the elemental composition of the first few atomic layers, typically 0.5 to 2.0 nm thick, of a specimen surface. In conjunction with inert gas ion sputtering, it is used to determine the sputter depth profile to a depth of a few micrometres. The specimen is normally a solid conductor, semiconductor, or insulator. For insulators, provisions may be required for control of charge accumulation at the surface (see Guide E 1523). Typical applications include the analysis of thin film deposits or segregated overlayers on metallic or alloy substrates. The specimen topography may vary from a smooth, polished specimen to a rough fracture surface. Auger analysis of specimens with volatile species that evaporate in the ultra-high vacuum environment of the Auger chamber and substances which are susceptible to electron or X-ray beam damage, such as organic compounds, may require special techniques not covered herein. (See Guide E 983.) |
||||||||||
1. Scope | ||||||||||
1.1 This practice outlines the necessary steps for the identification of elements in a given Auger spectrum obtained using conventional electron spectrometers. Spectra displayed as either the electron energy distribution (direct spectrum) or the first derivative of the electron energy distribution are considered. 1.2 This practice applies to Auger spectra generated by electron or X-ray bombardment of the specimen surface and can be extended to spectra generated by other methods such as ion bombardment. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
||||||||||
2. Referenced Documents | ||||||||||
|
Chcete mít jistotu, že používáte pouze platné technické normy?
Nabízíme Vám řešení, které Vám zajistí měsíční přehled o aktuálnosti norem, které používáte.
Chcete vědět více informací? Podívejte se na tuto stránku.
Poslední aktualizace: 31.05.2024 (Počet položek: 2 909 934)
© Copyright 2024 NORMSERVIS s.r.o.