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ASTM E1855-04e1
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors (Includes all amendments And changes 8/16/2017).
Automaticky přeložený název:
Standardní zkušební metoda pro použití 2N2222A Silicon bipolárních tranzistorů , jako neutronové Spectrum Senzory a vysídlení Monitory Damage
NORMA vydána dne 1.6.2004
Informace o normě:
Označení normy: ASTM E1855-04e1
Poznámka: NEPLATNÁ
Datum vydání normy: 1.6.2004
Kód zboží: NS-43326
Počet stran: 11
Přibližná hmotnost: 33 g (0.07 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Anotace textu normy ASTM E1855-04e1 :
Keywords:
displacement damage, neutron damage, radiation hardness, silicon transistors, spectrum sensors, ICS Number Code 31.200 (Integrated circuits. Microelectronics)
Doplňující informace
| 1. Scope | ||||||||||||||||||||||
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1.1 This test method covers the use of 2N2222A silicon bipolar transistors as dosimetry sensors in the determination of neutron energy spectra, and as silicon 1-MeV equivalent displacement damage fluence monitors. 1.2 The neutron displacement damage is especially valuable as a spectrum sensor in the range 0.1 to 2.0 MeV when fission foils are not available. It has been applied in the fluence range between 2 10 12 n/cm2 and 1 1014 n/cm2 and should be useful up to 1015 n/cm2. This test method details the steps for the acquisition and use of silicon 1-MeV equivalent fluence information (in a manner similar to the use of activation foil data) for the determination of neutron spectra. 1.3 In addition, this sensor can provide important confirmation of neutron spectra determined with other sensors, and yields a direct measurement of the silicon 1-MeV fluence by the transfer technique. 1.4 his standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory requirements prior to use. |
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| 2. Referenced Documents | ||||||||||||||||||||||
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