Potřebujeme váš souhlas k využití jednotlivých dat, aby se vám mimo jiné mohly ukazovat informace týkající se vašich zájmů. Souhlas udělíte kliknutím na tlačítko „OK“.
Standard Guide for Quantitative Analysis by Energy-Dispersive Spectroscopy (Includes all amendments And changes 11/19/2019).
Automaticky přeložený název:
Standardní Guide pro kvantitativní analýzu energeticky disperzní spektroskopie
NORMA vydána dne 1.12.2012
Označení normy: ASTM E1508-12a
Poznámka: NEPLATNÁ
Datum vydání normy: 1.12.2012
Kód zboží: NS-42001
Počet stran: 9
Přibližná hmotnost: 27 g (0.06 liber)
Země: Americká technická norma
Kategorie: Technické normy ASTM
Keywords:
EDS, elemental analysis, energy-dispersive spectroscopy, light element, matrix correction, microanalysis, phi-rho-z, quantitative analysis, spectrum, standardless analysis, standards, X ray, X-ray microanalysis, ZAF, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
Significance and Use | ||||||||
5.1 This guide covers procedures for quantifying the elemental composition of phases in a microstructure. It includes both methods that use standards as well as standardless methods, and it discusses the precision and accuracy that one can expect from the technique. The guide applies to EDS with a solid-state X-ray detector used on an SEM or EPMA. 5.2 EDS is a suitable technique for routine quantitative analysis of elements that are 1) heavier than or equal to sodium in atomic weight, 2) present in tenths of a percent or greater by weight, and 3) occupying a few cubic micrometres, or more, of the specimen. Elements of lower atomic number than sodium can be analyzed with either ultra-thin-window or windowless spectrometers, generally with less precision than is possible for heavier elements. Trace elements, defined as <1.0 %,2 can be analyzed but with lower precision compared with analyses of elements present in greater concentration. |
||||||||
1. Scope | ||||||||
1.1 This guide is intended to assist those using energy-dispersive spectroscopy (EDS) for quantitative analysis of materials with a scanning electron microscope (SEM) or electron probe microanalyzer (EPMA). It is not intended to substitute for a formal course of instruction, but rather to provide a guide to the capabilities and limitations of the technique and to its use. For a more detailed treatment of the subject, see Goldstein, et al.(1) This guide does not cover EDS with a transmission electron microscope (TEM). 1.2 Units—The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
||||||||
2. Referenced Documents | ||||||||
|
Historická
1.8.2007
Historická
1.4.2008
Historická
1.4.2008
Historická
15.12.2008
Historická
1.3.2010
Historická
1.4.2011
Poslední aktualizace: 01.11.2024 (Počet položek: 2 208 817)
© Copyright 2024 NORMSERVIS s.r.o.