Surface chemical analysis — X-ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
NORMA vydána dne 15.6.2004
Designation standards: ISO 21270:2004
Publication date standards: 15.6.2004
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: International technical standard
Kategorie: Technické normy ISO
Description / Abstract: ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.