Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
NORMA vydána dne 29.1.2020
Označení normy: ISO 21222:2020
Datum vydání normy: 29.1.2020
Počet stran: 17
Přibližná hmotnost: 51 g (0.11 liber)
Země: Mezinárodní technická norma
Kategorie: Technické normy ISO
Description / Abstract: This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.