Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007). (Endorsed by AENOR in February of 2008.)
NORMA vydána dne 1.11.2013
Designation standards: UNE-EN 62374:2007
Note: NEPLATNÁ
Publication date standards: 1.11.2013
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: Spanish technical standard
Kategorie: Technické normy UNE