Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
NORMA vydána dne 1.12.2016
Designation standards: UNE-EN 60749-44:2016
Publication date standards: 1.12.2016
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Spanish technical standard
Kategorie: Technické normy UNE