Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Espanola de Normalización in August of 2017.)
NORMA vydána dne 6.4.2025
Designation standards: UNE-EN 60749-28:2017
Note: NEPLATNÁ
Publication date standards: 6.4.2025
The number of pages: 52
Approximate weight : 156 g (0.34 lbs)
Country: Spanish technical standard
Kategorie: Technické normy UNE