UNE-EN 60749-2:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

NORMA vydána dne 30.5.2003

The information about the standard:

Designation standards: UNE-EN 60749-2:2003
Publication date standards: 30.5.2003
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: Spanish technical standard
Kategorie: Technické normy UNE