
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
NORMA vydána dne 21.11.2003
Designation standards: UNE-EN 60749-18:2003
Note: NEPLATNÁ
Publication date standards: 21.11.2003
The number of pages: 34
Approximate weight : 102 g (0.22 lbs)
Country: Spanish technical standard
Kategorie: Technické normy UNE