
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
NORMA vydána dne 21.11.2003
Designation standards: UNE-EN 60749-17:2003
Note: NEPLATNÁ
Publication date standards: 21.11.2003
The number of pages: 18
Approximate weight : 54 g (0.12 lbs)
Country: Spanish technical standard
Kategorie: Technické normy UNE