SAE J1752/2

Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

NORMA vydána dne 1.6.2011

The information about the standard:

Designation standards: SAE J1752/2
Note: Neaktuální
Publication date standards: 1.6.2011
Country: American technical standard
Kategorie: Technické normy SAE