JIS K0148:2026

Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

NORMA vydána dne 20.1.2026

Japonsky -
Elektronické PDF (NA DOTAZ)

Japonsky -

Tištěné (NA DOTAZ)

The information about the standard:

Designation standards: JIS K0148:2026
Publication date standards: 20.1.2026
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Other standards
Kategorie: Technické normy JIS