JIS K0146:2002

Surface chemical analysis -- Sputter depth profiling -- Optimization using layered systems as reference materials

NORMA vydána dne 30.4.2002

The information about the standard:

Designation standards: JIS K0146:2002
Publication date standards: 30.4.2002
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Other standards
Kategorie: Technické normy JIS