JIS H0611:1994

Methods of measurement of thickness, thickness variation and bow for silicon wafer

NORMA vydána dne 28.2.1994

The information about the standard:

Designation standards: JIS H0611:1994
Publication date standards: 28.2.1994
The number of pages: 6
Approximate weight : 18 g (0.04 lbs)
Country: Other standards
Kategorie: Technické normy JIS