IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Informace o normě:

Označení normy: IEEE/IEC 62526-2007
Datum vydání normy: 9.12.2007
Přibližná hmotnost: 300 g (0.66 liber)
Země: Mezinárodní technická norma
Kategorie: Technické normy IEEE

Anotace textu normy IEEE/IEC 62526-2007 :

New IEEE Standard - Active.
Standard Test Interface Language (STIL) provides an interface between digital test
generation tools and test equipment. Extensions to the test interface language (contained in this
standard) are defined that (1) facilitate the use of the language in the design environment and
(2) facilitate the use of the language for large designs encompassing subdesigns with reusable
patterns.

ISBN: 9-7807-3815-7221
Number of Pages: 128
Product Code: STD95741
Keywords: advanced scan architecture, core, environment, fail feedback, lockstep, parallel
patterns, parameterized data, pattern tiling, pragma, signal variable, system on chip (SoC), test
protocol
Category: Test Instrumentation and Techniques