IEEE 1804-2017

Annotation of standard text IEEE 1804-2017 :

New IEEE Standard - Active.
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and (iii) fault coverage reporting across different ATPG (automatic test pattern generation) tools, for the single stuck-at fault model. With this standard, it shall be incumbent on all ATPG tools (which comply with this standard) to report fault coverage in a uniform way. This will facilitate the generation of a uniform coverage (and hence a uniform test quality) metric for large chips (including systems-on-chips – SOCs) with different cores and modules, for which test patterns have been independently generated.

ISBN: 978-1-5044-4317-3, 978-1-5044-4318-0
Number of Pages: 29
Product Code: STD22771, STDPD22771
Keywords: ATPG, DFT, fault models, fault simulation, IEEE 1804, semiconductor testing, stuck-at faults, test coverage.
Category: Test Technology