
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
NORMA vydána dne 5.12.2008
Designation standards: IEEE 1620-2008
Note: NEPLATNÁ
Publication date standards: 5.12.2008
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Kategorie: Technické normy IEEE