IEEE Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Informace o normě:

Označení normy: IEEE 1450.1-2025
Datum vydání normy: 26.6.2025
Počet stran: 141
Přibližná hmotnost: 454 g (1.00 liber)
Země: Mezinárodní technická norma
Kategorie: Technické normy IEEE

Anotace textu normy IEEE 1450.1-2025 :

Revision Standard - Active.
An interface between digital test generation tools and test equipment is provided by Standard Test Interface Language (STIL). Extensions to the test interface language (contained in this standard) are defined that facilitate the use of the language in the design environment and facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.

ISBN: 979-8-8557-2140-9, 979-8-8557-2141-6
Number of Pages: 141
Product Code: STD27889, STDPD27889
Keywords: advanced scan architecture, core, environment, fail feedback, IEEE 1450.1, lockstep, parallel patterns, parameterized data, pattern tiling, pragma, signal variable, SoC, system on chip, test protocol
Category: Test Technology