Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
NORMA vydána dne 7.11.2007
Označení normy: IEC 62526-ed.1.0
Datum vydání normy: 7.11.2007
Počet stran: 123
Přibližná hmotnost: 400 g (0.88 liber)
Země: Mezinárodní technická norma
Kategorie: Technické normy IEC
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.