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IEC 62951-8-ed.1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

NORMA vydána dne 19.1.2023

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Informace o normě:

Označení normy: IEC 62951-8-ed.1.0
Datum vydání normy: 19.1.2023
Počet stran: 14
Přibližná hmotnost: 42 g (0.09 liber)
Země: Mezinárodní technická norma
Kategorie: Technické normy IEC

Anotace textu normy IEC 62951-8-ed.1.0 :

IEC 62951-8:2023 (E) defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.