Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

Informace o normě:

Označení normy: IEC 60749-31-ed.1.0
Datum vydání normy: 30.8.2002
Počet stran: 9
Přibližná hmotnost: 27 g (0.06 liber)
Země: Mezinárodní technická norma
Kategorie: Technické normy IEC

Anotace textu normy IEC 60749-31-ed.1.0 :

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispositifs discrets et circuits integres), cet essai determine si le dispositif prend feu par suite dun echauffement interne du a des surcharges excessives. Le contenu du corrigendum daout 2003 a ete pris en consideration dans cet exemplaire.