GB/T 4937.40-2025

Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge

NORMA vydána dne 31.12.2025

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The information about the standard:

Designation standards: GB/T 4937.40-2025
Publication date standards: 31.12.2025
Country: Chinese technical standard
Kategorie: Technické normy GB