GB/T 4937.23-2023

Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life

NORMA vydána dne 23.5.2023

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The information about the standard:

Designation standards: GB/T 4937.23-2023
Publication date standards: 23.5.2023
Country: Chinese technical standard
Kategorie: Technické normy GB