
Fine ceramics—Test method for crystalline quality of single-crystal thin film (wafer) using XRD method with parallel X-ray beam
NORMA vydána dne 25.5.2026
Designation standards: GB/T 47625-2026
Note: K dispozici od: prosinec 2026
Publication date standards: 25.5.2026
Country: Chinese technical standard
Kategorie: Technické normy GB