GB/T 43313-2023

Test method for surface quality and micropipe density of polished silicon carbide wafers—Confocal and differential interferometry optics

NORMA vydána dne 27.11.2023

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The information about the standard:

Designation standards: GB/T 43313-2023
Publication date standards: 27.11.2023
Country: Chinese technical standard
Kategorie: Technické normy GB