GB/T 42907-2023

Test method for excess-charge-carrier recombination lifetime in silicon ingots, silicon bricks and silicon wafers—Noncontact eddy-current sensor

NORMA vydána dne 6.8.2023

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The information about the standard:

Designation standards: GB/T 42907-2023
Publication date standards: 6.8.2023
Country: Chinese technical standard
Kategorie: Technické normy GB