GB/T 42709.3-2026

Semiconductor devices—Micro-electromechanical devices—Part 3: Thin film standard test piece for tensile testing

NORMA vydána dne 30.4.2026

Anglicky a čínsky -
Elektronické PDF (NA DOTAZ)

The information about the standard:

Designation standards: GB/T 42709.3-2026
Note: K dispozici od: listopad 2026
Publication date standards: 30.4.2026
Country: Chinese technical standard
Kategorie: Technické normy GB