
Semiconductor devices—Micro-electromechanical devices—Part 2: Tensile testing method of thin film materials
NORMA vydána dne 30.4.2026
Designation standards: GB/T 42709.2-2026
Note: K dispozici od: listopad 2026
Publication date standards: 30.4.2026
Country: Chinese technical standard
Kategorie: Technické normy GB