GB/T 33657-2017

Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells

NORMA vydána dne 12.5.2017

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The information about the standard:

Designation standards: GB/T 33657-2017
Publication date standards: 12.5.2017
Country: Chinese technical standard
Kategorie: Technické normy GB