GB/T 30869-2014

Test method for thickness and total thickness variation of silicon wafers for solar cell

NORMA vydána dne 24.7.2014

Anglicky a čínsky -
Elektronické PDF (4823.80 CZK)

The information about the standard:

Designation standards: GB/T 30869-2014
Publication date standards: 24.7.2014
Country: Chinese technical standard
Kategorie: Technické normy GB