GB/T 30867-2014

Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers

NORMA vydána dne 24.7.2014

The information about the standard:

Designation standards: GB/T 30867-2014
Note: NEPLATNÁ
Publication date standards: 24.7.2014
Country: Chinese technical standard
Kategorie: Technické normy GB