GB/T 30701-2014

Surface chemical analysisChemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy

NORMA vydána dne 27.3.2014

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The information about the standard:

Designation standards: GB/T 30701-2014
Publication date standards: 27.3.2014
Country: Chinese technical standard
Kategorie: Technické normy GB