GB/T 26068-2018

Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method

NORMA vydána dne 28.12.2018

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The information about the standard:

Designation standards: GB/T 26068-2018
Publication date standards: 28.12.2018
Country: Chinese technical standard
Kategorie: Technické normy GB