GB/T 24576-2009

Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction

NORMA vydána dne 30.10.2009

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The information about the standard:

Designation standards: GB/T 24576-2009
Publication date standards: 30.10.2009
Country: Chinese technical standard
Kategorie: Technické normy GB