GB/T 14145-1993

Test method for stacking fault density of epitaxial layers of silicon by interference-contrast microscopy

NORMA vydána dne 6.2.1993

The information about the standard:

Designation standards: GB/T 14145-1993
Note: NEPLATNÁ
Publication date standards: 6.2.1993
Country: Chinese technical standard
Kategorie: Technické normy GB