GB/T 13388-1992

Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

NORMA vydána dne 19.2.1992

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The information about the standard:

Designation standards: GB/T 13388-1992
Note: NEPLATNÁ
Publication date standards: 19.2.1992
Country: Chinese technical standard
Kategorie: Technické normy GB