E DIN IEC 60749-23:2002-10

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.

NORMA vydána dne 1.10.2002

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The information about the standard:

Designation standards: E DIN IEC 60749-23:2002-10
Note: NEPLATNÁ
Publication date standards: 1.10.2002
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: German technical standard
Kategorie: Technické normy DIN

Annotation of standard text E DIN IEC 60749-23:2002-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur.