
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Aluminium (Al), Arsenic (As), Barium (Ba), Beryllium (Be), Bismuth (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chromium (Cr), Copper (Cu), Iron (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Potassium (K), Lithium (Li), Magnesium (Mg), Manganese (Mn), Molybdenum (Mo), Nickel (Ni), Niobium (Nb), Lead (Pb), Antimony (Sb), Tin (Sn), Strontium (Sr), Tantalum (Ta), Titani...
NORMA vydána dne 1.11.2012
Designation standards: E DIN 50451-3:2012-11
Note: NEPLATNÁ
Publication date standards: 1.11.2012
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: German technical standard
Kategorie: Technické normy DIN
Prüfung von Materialien für die Halbleitertechnologie - Bestimmung von Elementspuren in Flüssigkeiten - Teil 3: Aluminium (Al), Arsen (As), Barium (Ba), Beryllium (Be), Bismut (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chrom (Cr), Kupfer (Cu), Eisen (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Kalium (K), Lithium (Li), Magnesium (Mg), Mangan (Mn), Molybdän (Mo), Nickel (Ni), Niob (Nb), Blei (Pb), Antimon (Sb), Zinn (Sn), Strontium (Sr), Tantal (Ta), Titan (Ti), Vanadium ...