BS ISO 17331:2004+A1:2010

Surface chemical analysis. Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy.

NORMA vydána dne 30.9.2010

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The information about the standard:

Designation standards: BS ISO 17331:2004+A1:2010
Publication date standards: 30.9.2010
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: British technical standard
Kategorie: Technické normy BS

Annotation of standard text BS ISO 17331:2004+A1:2010 :

ISBN: 978 0 580 64479 5 Status: Definitive