BS IEC 62373-1:2020

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). Fast BTI test for MOSFET.

NORMA vydána dne 30.3.2023

The information about the standard:

Designation standards: BS IEC 62373-1:2020
Publication date standards: 30.3.2023
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: British technical standard
Kategorie: Technické normy BS